A generalized approach to optical low-coherence reflectometry including spectral filtering effects

Journal of Lightwave Technology

Volumn 16, Issue 7, 1998, Pages 1343-1347

  Wiedmann, U ^a   Gallion, P ^b   Duan, Guang Hua ^b  

^a TELECOM PARISTECH   (France)

^b NONE

Author keywords

Low coherence reflectometry; Optical interferometry; Spectral filtering

Indexed keywords

DIFFRACTION GRATINGS; OPTICAL FILTERS; REFLECTOMETERS; SEMICONDUCTOR LASERS; SIGNAL FILTERING AND PREDICTION;

SPECTRAL FILTERING;

LIGHT MEASUREMENT;

EID: 0032122947     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/50.701415     Document Type: Article

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