XPS studies of V 2 O 5 thin film at different temperatures and oxygen partial pressures

Applied Surface Science

Volumn 126, Issue 3-4, 1998, Pages 347-351

  Chen, Yongsheng ^a   Xie, Kan ^a   Liu, Zhenxiang ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

Adsorption; Oxygen; Surface diffusion; Vanadium oxide; X ray photoelectron spectroscopy

Indexed keywords

ACTIVATION ENERGY; DIFFUSION; DISSOCIATION; OXIDES; OXYGEN; SURFACES; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

OXYGEN PARTIAL PRESSURE; SURFACE DIFFUSION; VANADIUM OXIDE;

ADSORPTION;

EID: 0032473708     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(97)00791-5     Document Type: Article

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