Tunneling through a metal/polymer interface containing a thin oxide layer: Discussion of the consequences of oxide presence on charge injection

Interface Science

Volumn 6, Issue 3, 1998, Pages 235-241

  Koehler, M ^a   Hummelgen I A ^a  

^a FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

Author keywords

Charge injection; Metal polymer interfaces; Organic light emitting diodes; Tunneling

Indexed keywords

APPROXIMATION THEORY; CURRENT DENSITY; ELECTRODES; ELECTRON ENERGY LEVELS; EVAPORATION; LIGHT EMITTING DIODES; MATHEMATICAL MODELS; PERMITTIVITY; POLYMERS; POTENTIAL ENERGY; PROBABILITY; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON TUNNELING; OXIDATION; OXIDES; PLASTIC FILMS; THIN FILMS;

CHARGE INJECTION; FOWLER-NORDHEIM MODEL; METAL/POLYMER INTERFACES; ORGANIC LIGHT EMITTING DIODES;

THIN FILMS; INTERFACES (MATERIALS);

EID: 0032120655     PISSN: 09277056     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008620403836     Document Type: Article

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