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Volumn 168, Issue 1, 1998, Pages 37-48

Investigation of precipitation in Czochralski silicon by phonon spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CARBON; OXYGEN; PRECIPITATION (CHEMICAL); SINGLE CRYSTALS; SPECTROSCOPY; SUPERCONDUCTING MATERIALS;

EID: 0032119942     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199807)168:1<37::AID-PSSA37>3.0.CO;2-Q     Document Type: Article
Times cited : (3)

References (32)
  • 6
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    • Oxygen in Silicon
    • Academic Press, New York
    • F. SHIMURA (Ed.), Oxygen in Silicon, in: Semiconductors and Semimetals. Vol. 42, Academic Press, New York 1995.
    • (1995) Semiconductors and Semimetals , vol.42
    • Shimura, F.1
  • 11
    • 1942523934 scopus 로고
    • K. SUMINO (Ed.), North Holland Publ. Co., Amsterdam
    • M. REICHE, in: Defect Control in Semiconductors, K. SUMINO (Ed.), North Holland Publ. Co., Amsterdam 1990 (p. 239).
    • (1990) Defect Control in Semiconductors , pp. 239
    • Reiche, M.1
  • 14
    • 85023543532 scopus 로고
    • Academic Press, New York
    • W. EISENMENGER, in: Phys. Acoustics, Vol. 12, Academic Press, New York 1981 (p. 79).
    • (1981) Phys. Acoustics , vol.12 , pp. 79
    • Eisenmenger, W.1
  • 16
    • 11744342947 scopus 로고    scopus 로고
    • C. WURSTER, E. DITTRICH, W. SCHEITLER, K. LASSMANN, W. EISENMENGER, and W. ZULEHNER, Proc. PHONONS 95, Sapporo, 1995; Physica 219/220B, 763 (1996).
    • (1996) Physica , vol.219-220 B , pp. 763
  • 27
    • 3743150518 scopus 로고    scopus 로고
    • O. DEGRYSE, P. CLAUWS, J. VANHELLEMONT, and C. CLAEYS, in: Proc. ICDS-19, Aveiro, July 1997, Mater. Sci. Forum 258/263, 405 (1997).
    • (1997) Mater. Sci. Forum , vol.258-263 , pp. 405


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.