Surface magnetic domain observation on thin-gauged 3% Si-Fe sheets by using scanning electron microscopy with polarization analysis (SEMPA)

IEEE Transactions on Magnetics

Volumn 34, Issue 4 PART 1, 1998, Pages 1165-1167

  Lee, A R ^a,b   Koymen, ^a,c,d  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

^b Korea Electric Power Research Institute (KEPRI)   (South Korea)

^c Korea Institute of Science and Technology   (South Korea)

^d POSCO   (South Korea)

Author keywords

Imaging; Magnetic domains; Si Fe; Terms SEMPA

Indexed keywords

ANNEALING; COLD ROLLING; HOT ROLLING; IRON; MELTING; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SHEET METAL; SILICON;

INDUCTION MELTING; MAGNETIC INDUCTION; SCANNING ELECTRON MICROSCOPY WITH POLARIZATION ANALYSIS (SEMPA); VACUUM ANNEALING;

MAGNETIC DOMAINS;

EID: 0032119493     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.706430     Document Type: Article

References (7)

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