SCOPUS 정보 검색 플랫폼

Review of Scientific Instruments

Volumn 61, Issue 10, 1990, Pages 2501-2527

Scanning electron microscopy with polarization analysis (SEMPA)

(5) Scheinfein, M R a Unguris, J a Kelley, M H a Pierce, D T a Celotta, R J a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549102097 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1141908 Document Type: Review

Times cited : (207)

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