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Volumn E81-D, Issue 7, 1998, Pages 724-730

Logic optimization: Redundancy addition and removal using implication relations

Author keywords

Implication; Logic optimization; Redundancy identification

Indexed keywords

FORMAL LOGIC; OPTIMIZATION; REDUNDANCY;

EID: 0032118658     PISSN: 09168532     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (13)
  • 2
    • 0024753283 scopus 로고
    • The transduction method-design of logic networks based on permissible functions
    • S. Muroga, Y. Kambayashi, H.C. Lai, and J.N. Culliney, "The transduction method-design of logic networks based on permissible functions," IEEE Trans. Comput., vol.38, 10, pp. 1404-1424, 1989.
    • (1989) IEEE Trans. Comput. , vol.38 , Issue.10 , pp. 1404-1424
    • Muroga, S.1    Kambayashi, Y.2    Lai, H.C.3    Culliney, J.N.4
  • 4
    • 0027867675 scopus 로고
    • Sequential logic optimization by redundancy addition and removal
    • L. Entrena and K.T. Cheng, "Sequential logic optimization by redundancy addition and removal," Proc. Int'l Conf. on CAD, pp.310-315, 1993.
    • (1993) Proc. Int'l Conf. on CAD , pp. 310-315
    • Entrena, L.1    Cheng, K.T.2
  • 5
    • 0028712931 scopus 로고
    • Perturb and simplify: Multi-level boolean network optimizer
    • S.C. Chang and M.M. Sadowska, "Perturb and simplify: Multi-level boolean network optimizer," Proc. Int'l Conf. on CAD, pp.2-5, 1994.
    • (1994) Proc. Int'l Conf. on CAD , pp. 2-5
    • Chang, S.C.1    Sadowska, M.M.2
  • 6
    • 0002603324 scopus 로고
    • Multi-level logic optimization by implication analysis
    • W. Kunz and P.R. Menon, "Multi-level logic optimization by implication analysis," Proc. Int'l Conf. on CAD, 1994.
    • (1994) Proc. Int'l Conf. on CAD
    • Kunz, W.1    Menon, P.R.2
  • 7
    • 84961249468 scopus 로고
    • Recursive learning: An attractive alternative to the decision tree for test generation in digital circuits
    • W. Kunz and P.R. Menon, "Recursive learning: An attractive alternative to the decision tree for test generation in digital circuits," Proc. Int'l Test Conf., pp.816-825, 1992.
    • (1992) Proc. Int'l Test Conf. , pp. 816-825
    • Kunz, W.1    Menon, P.R.2
  • 8
    • 0346382368 scopus 로고
    • One-pass redundancy identification and removal
    • M. Abramovici and M.A. Iyer, "One-pass redundancy identification and removal," Proc. Int'l Test Conf., pp.807-815, 1992.
    • (1992) Proc. Int'l Test Conf. , pp. 807-815
    • Abramovici, M.1    Iyer, M.A.2
  • 9
    • 0028115179 scopus 로고
    • Low-cost redundancy identification for combinational circuits
    • India
    • M.A. Iyer and M. Abramovici, "Low-cost redundancy identification for combinational circuits," Proc. 7th. Int'l. Conf. on VLSI Design, India, pp.315-318, 1994.
    • (1994) Proc. 7th. Int'l. Conf. on VLSI Design , pp. 315-318
    • Iyer, M.A.1    Abramovici, M.2
  • 10
    • 33746161404 scopus 로고    scopus 로고
    • On invariant implication relations for removing partial circuits
    • Dec.
    • H. Ichihara, S. Kajihara, and K. Kinoshita, "On invariant implication relations for removing partial circuits," IEICE Trans., vol.J79-D-I, no.12, pp.1037-1045, Dec. 1996.
    • (1996) IEICE Trans. , vol.J79-D-I , Issue.12 , pp. 1037-1045
    • Ichihara, H.1    Kajihara, S.2    Kinoshita, K.3
  • 11
    • 11644253336 scopus 로고    scopus 로고
    • New redundancy identification method on logic optimization using implication relations
    • April
    • H. Ichihara and K. Kinoshita, "New redundancy identification method on logic optimization using implication relations," Technol. Rept. Osaka Univ., vol.48, no.2308, pp.55-63, April 1998.
    • (1998) Technol. Rept. Osaka Univ. , vol.48 , Issue.2308 , pp. 55-63
    • Ichihara, H.1    Kinoshita, K.2
  • 12
    • 0023865139 scopus 로고
    • SOCRATES: A highly efficient automatic test pattern generation system
    • M.H. Schulz, E. Trischler, and T.M. Sarfert, "SOCRATES: A highly efficient automatic test pattern generation system," IEEE Trans. CAD, pp.126-137, 1988.
    • (1988) IEEE Trans. CAD , pp. 126-137
    • Schulz, M.H.1    Trischler, E.2    Sarfert, T.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.