Stabilized three-wavelength source calibrated by electronic means for high-accuracy absolute distance measurement

Optics Letters

Volumn 21, Issue 7, 1996, Pages 531-533

  Zimmermann, E ^a   Salvade Y ^a   Dandliker R ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010475958     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.21.000531     Document Type: Article

References (8)

1. J. C. Wyant, in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 397-402.
2. A. F. Fercher, H. Z. Hu, and U. Vry, Appl. Opt. 24, 2181 (1985).
3. R. Dändliker, K. Hug, E. Zimmermann, and U. Schnell, presented at the Second Japan-France Congress on Mechatronics, (Takamatsu, Japan, 1994).
4. R. Dändliker, K. Hug, J. Politch, and E. Zimmerman, Opt. Eng. 34, 2407 (1995).
5. T. Ikegami, S. Sudo, and Y. Sakai, Frequency Stabilization of Semiconductor Laser Diodes (Artech, London, 1995), Chaps. 3.2 and 4.1.
6. T. Okoshi, K. Kikuchi, and A. Nakayama, Electron. Lett. 16, 631 (1980).
7. D. W. Allan, Proc. IEEE 54, 221 (1966).
8. J. Schmit and K. Creath, Appl. Opt. 34, 3610 (1995).