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Thin Solid Films

Volumn 325, Issue 1-2, 1998, Pages 175-180

Degradation in organic light-emitting diodes

(5) Nguyen, T P a Jolinat, P b Destruel, P b Clergereaux, R b Farenc, J b

a INSTITUT DES MATÉRIAUX JEAN ROUXEL (France)

b UNIVERSITÉ DE TOULOUSE (France)

Author keywords

Degradation mechanism; Light emitting diodes; Transport layers

Indexed keywords

CHARGE TRANSFER; CURRENT DENSITY; DEGRADATION; OPTICAL VARIABLES MEASUREMENT; SEMICONDUCTING ALUMINUM COMPOUNDS;

TRISHYDROXYQUINOLINE;

LIGHT EMITTING DIODES;

EID: 0032115489 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(98)00425-8 Document Type: Article

Times cited : (24)

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