Photoemission study of ultra-thin vanadium films on Cu(100)

Vacuum

Volumn 50, Issue 3-4, 1998, Pages 245-249

  Pervan, P ^a   Valla, T ^a   Milun, M ^a  

^a INSTITUTE OF PHYSICS   (Croatia)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; AUGER ELECTRON SPECTROSCOPY; BAND STRUCTURE; ELECTRONIC PROPERTIES; FILM GROWTH; LOW ENERGY ELECTRON DIFFRACTION; PHASE TRANSITIONS; PHOTOEMISSION; SURFACE STRUCTURE; THICKNESS MEASUREMENT; ULTRATHIN FILMS; VANADIUM;

ANGULAR PHOTOEMISSION SPECTROSCOPY; VALENCE BAND SPECTRUM;

METALLIC FILMS;

EID: 0032108789     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00049-9     Document Type: Article

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