Texture and secondary extinction measurements in Al/Ti stratified films by X-ray diffraction

Vacuum

Volumn 50, Issue 3-4, 1998, Pages 497-502

  Tomov, I ^a   Adamik, M ^b   Barna, P B ^b   Yamakov, V ^a  

^a BULGARIAN ACADEMY OF SCIENCES   (Bulgaria)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; DIFFRACTOMETERS; FILM GROWTH; TEXTURES; TITANIUM; VOLUME FRACTION; X RAY DIFFRACTION ANALYSIS;

SECONDARY EXTINCTION; TEXTURE DIFFRACTOMETER;

METALLIC FILMS;

EID: 0032108784     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(98)00089-x     Document Type: Article

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