Investigation of porous silicon morphology for electron emission applications

Ultramicroscopy

Volumn 73, Issue 1-4, 1998, Pages 237-245

  Kleps, Irina ^a   Nicolaescu, Dan ^b   Garcia, Nicolas ^c   Serena, Pedro ^c   Gil, Adriana ^c   Zlatkin, Alexander ^c  

^a NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES   (Romania)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^c CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRACKS; ELECTRON EMISSION; MORPHOLOGY; OPTICAL MICROSCOPY; OXIDATION; POROSITY; SECONDARY ION MASS SPECTROMETRY; SURFACES;

HILLOCKS; SCANNING FORCE MICROSCOPY;

POROUS SILICON;

SILICON;

CONFERENCE PAPER; ELECTRON TRANSPORT; MOLECULAR DYNAMICS; MOLECULAR SIZE; POSITRON; QUANTUM MECHANICS; SCANNING FORCE MICROSCOPY;

EID: 0032104065     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00162-9     Document Type: Conference Paper

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