Mechanism of subsurface imaging in scanning tunneling microscopy

Ultramicroscopy

Volumn 73, Issue 1-4, 1998, Pages 163-168

  Kobayashi, Katsuyoshi ^a  

^a OCHANOMIZU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC DENSITY OF STATES; ELECTRONS; FERMI LEVEL; MOIRE FRINGES; SURFACES;

ATOMIC SCALE WAVES; MOIRE PATTERNS; NANO SCALE WAVES; SUBSURFACE IMAGING;

SCANNING TUNNELING MICROSCOPY;

CONFERENCE PAPER; IMAGE PROCESSING; MATHEMATICAL ANALYSIS; QUANTUM MECHANICS; SCANNING TUNNELING MICROSCOPY; SIGNAL PROCESSING;

EID: 0032103087     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00150-2     Document Type: Conference Paper

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