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Volumn 120, Issue 2, 1998, Pages 160-165

Real-time monitoring and simulation of thermal deformation in plastic package

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COMPUTER SIMULATION; FINITE ELEMENT METHOD; INTERFEROMETRY; MOIRE FRINGES; PLASTICS APPLICATIONS; REAL TIME SYSTEMS; THERMAL CYCLING; THERMAL STRESS;

EID: 0032096633     PISSN: 10437398     EISSN: 15289044     Source Type: Journal    
DOI: 10.1115/1.2792609     Document Type: Article
Times cited : (8)

References (15)
  • 1
    • 0027662512 scopus 로고
    • Solder Ball Connect (SBC) Assemblies Under Thermal Loading: I. Deformation Measurement via Moiré Interferometry and Its Interpretation
    • Guo, Y., Lim, C. K., Chen, W. T., and Woychik, C. G., 1993, “Solder Ball Connect (SBC) Assemblies Under Thermal Loading: I. Deformation Measurement via Moiré Interferometry and Its Interpretation,” IBM J. of Research and Development, Vol. 37, No. 5, pp. 635-647.
    • (1993) IBM J. Of Research and Development , vol.37 , Issue.5 , pp. 635-647
    • Guo, Y.1    Lim, C.K.2    Chen, W.T.3    Woychik, C.G.4
  • 7
    • 0347285210 scopus 로고
    • Applications of Optical Methods to Electronic Packaging
    • ASME, NY
    • Suhling, J. C. and Lin, S. T. 1995, “Applications of Optical Methods to Electronic Packaging,”ASME AWM 1995, ASME, NY, pp. 109-114.
    • (1995) ASME AWM 1995 , pp. 109-114
    • Suhling, J.C.1    Lin, S.T.2
  • 8
    • 0347915507 scopus 로고    scopus 로고
    • Modeling and Validation of Thermally-Induced Failure Mechanisms in Microelectronic Packaging
    • Mechanical Engineering Department, Wayne State University, Detroit, MI
    • Zhu, J. S., 1996, “Modeling and Validation of Thermally-Induced Failure Mechanisms in Microelectronic Packaging,” Ph.D. dissertation, Mechanical Engineering Department, Wayne State University, Detroit, MI.
    • (1996) Ph.D. Dissertation
    • Zhu, J.S.1
  • 9
    • 0344951659 scopus 로고    scopus 로고
    • High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry
    • Proceedings of VIII International Congress on Experimental Mechanics, Nashville, Tennessee, June
    • Zhu, J. S., Zou, D. Q., Dai, F. L., Liu, S., and Guo, Y., 1996a, “High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry,” Proceedings of VIII International Congress on Experimental Mechanics, Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP), Vol. 1, Nashville, Tennessee, June 10-12.
    • (1996) Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP) , vol.1 , pp. 10-12
    • Zhu, J.S.1    Zou, D.Q.2    Dai, F.L.3    Liu, S.4    Guo, Y.5
  • 11
    • 0030381711 scopus 로고    scopus 로고
    • Thermal Behavior Study of Power Plastic Package by High Temperature Moiré Interferometry and FEA Modeling
    • EEP, Structural Analysis in Microelectronics and Fiber Optics, Atlanta, Georgia, Nov
    • Zhu, J. S., Zou, D. Q., Liu, S., and Benson, J., 1996c, “Thermal Behavior Study of Power Plastic Package by High Temperature Moiré Interferometry and FEA Modeling,” Proceedings of the International Mechanical Engineering Congress and Exposition, EEP-Vol. 16, Structural Analysis in Microelectronics and Fiber Optics, Atlanta, Georgia, Nov. 17-22.
    • (1996) Proceedings of the International Mechanical Engineering Congress and Exposition , vol.16 , pp. 17-22
    • Zhu, J.S.1    Zou, D.Q.2    Liu, S.3    Benson, J.4
  • 13
    • 0344951659 scopus 로고    scopus 로고
    • High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry
    • Zhu, J. S., Zou, D. Q., Dai, F. L., and Liu, S., 1997a, “High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry,”Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP), Vol. 1.
    • (1997) Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP) , vol.1
    • Zhu, J.S.1    Zou, D.Q.2    Dai, F.L.3    Liu, S.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.