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1
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0027662512
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Solder Ball Connect (SBC) Assemblies Under Thermal Loading: I. Deformation Measurement via Moiré Interferometry and Its Interpretation
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Guo, Y., Lim, C. K., Chen, W. T., and Woychik, C. G., 1993, “Solder Ball Connect (SBC) Assemblies Under Thermal Loading: I. Deformation Measurement via Moiré Interferometry and Its Interpretation,” IBM J. of Research and Development, Vol. 37, No. 5, pp. 635-647.
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(1993)
IBM J. Of Research and Development
, vol.37
, Issue.5
, pp. 635-647
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Guo, Y.1
Lim, C.K.2
Chen, W.T.3
Woychik, C.G.4
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2
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85025194923
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presented at the SEM Spring Conference, Baltimore, MD, June 6-8
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Guo, Y., and Lim, C. K., 1994, “Hybrid Method for Strain/Stress Analysis in Electronic Packaging Using Moiré Interferometry and FEM,” presented at the SEM Spring Conference, Baltimore, MD, June 6-8.
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(1994)
Hybrid Method for Strain/Stress Analysis in Electronic Packaging Using Moiré Interferometry and FEM
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Guo, Y.1
Lim, C.K.2
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3
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0029231814
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presented at the ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina, Hawaii, March 26-30
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Guo, Y., 1995, “Experimental Determination of Effective Coefficients of Thermal Expansion in Electronic Packaging,” presented at the ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina, Hawaii, March 26-30.
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(1995)
Experimental Determination of Effective Coefficients of Thermal Expansion in Electronic Packaging
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Guo, Y.1
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4
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85025206332
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presented at the International Mechanical Engineering Congress & Exposition, ASME, Chicago, Illinois, November 6-11
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Han, B., and Guo, Y., 1994, “Thermal Deformation Analysis of Various Electronic Packaging Products by Moiré and Microscopic Moiré Interferometry,” presented at the International Mechanical Engineering Congress & Exposition, ASME, Chicago, Illinois, November 6-11.
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(1994)
Thermal Deformation Analysis of Various Electronic Packaging Products by Moiré and Microscopic Moiré Interferometry
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Han, B.1
Guo, Y.2
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5
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0029231813
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presented at the ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina, Hawaii, March 26-30
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Han, B., Guo, Y and Lim, C. K., 1995, “Application of Interferometric Techniques to Verification of Numerical Model for Microelectronics Packaging Design,” presented at the ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina, Hawaii, March 26-30.
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(1995)
Application of Interferometric Techniques to Verification of Numerical Model for Microelectronics Packaging Design
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Han, B.1
Guo, Y.2
Lim, C.K.3
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6
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0003713904
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Springer-Verlag, NY
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Post, D., Han, B., and Ifju, P., 1993, “High Sensitivity Moiré: Experimental Analysis for Mechanics and Materials,” Springer-Verlag, NY.
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(1993)
High Sensitivity Moiré: Experimental Analysis for Mechanics and Materials
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Post, D.1
Han, B.2
Ifju, P.3
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7
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0347285210
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Applications of Optical Methods to Electronic Packaging
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ASME, NY
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Suhling, J. C. and Lin, S. T. 1995, “Applications of Optical Methods to Electronic Packaging,”ASME AWM 1995, ASME, NY, pp. 109-114.
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(1995)
ASME AWM 1995
, pp. 109-114
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Suhling, J.C.1
Lin, S.T.2
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8
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0347915507
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Modeling and Validation of Thermally-Induced Failure Mechanisms in Microelectronic Packaging
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Mechanical Engineering Department, Wayne State University, Detroit, MI
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Zhu, J. S., 1996, “Modeling and Validation of Thermally-Induced Failure Mechanisms in Microelectronic Packaging,” Ph.D. dissertation, Mechanical Engineering Department, Wayne State University, Detroit, MI.
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(1996)
Ph.D. Dissertation
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Zhu, J.S.1
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9
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0344951659
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High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry
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Proceedings of VIII International Congress on Experimental Mechanics, Nashville, Tennessee, June
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Zhu, J. S., Zou, D. Q., Dai, F. L., Liu, S., and Guo, Y., 1996a, “High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry,” Proceedings of VIII International Congress on Experimental Mechanics, Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP), Vol. 1, Nashville, Tennessee, June 10-12.
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(1996)
Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP)
, vol.1
, pp. 10-12
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Zhu, J.S.1
Zou, D.Q.2
Dai, F.L.3
Liu, S.4
Guo, Y.5
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10
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0347285209
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High Temperature Deformation Analysis of A Flip-Chip Assembly by Moiré Interferometry
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Austin, Texas, Oct. 14-16
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Zhu, J. S., Zou, D. Q., Dai, F. L., and Liu, S., 1996b, “High Temperature Deformation Analysis of A Flip-Chip Assembly by Moiré Interferometry,” Proceedings of 1996 International Electronics Manufacturing Technology Symposium, Austin, Texas, Oct. 14-16.
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(1996)
Proceedings of 1996 International Electronics Manufacturing Technology Symposium
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Zhu, J.S.1
Zou, D.Q.2
Dai, F.L.3
Liu, S.4
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11
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0030381711
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Thermal Behavior Study of Power Plastic Package by High Temperature Moiré Interferometry and FEA Modeling
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EEP, Structural Analysis in Microelectronics and Fiber Optics, Atlanta, Georgia, Nov
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Zhu, J. S., Zou, D. Q., Liu, S., and Benson, J., 1996c, “Thermal Behavior Study of Power Plastic Package by High Temperature Moiré Interferometry and FEA Modeling,” Proceedings of the International Mechanical Engineering Congress and Exposition, EEP-Vol. 16, Structural Analysis in Microelectronics and Fiber Optics, Atlanta, Georgia, Nov. 17-22.
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(1996)
Proceedings of the International Mechanical Engineering Congress and Exposition
, vol.16
, pp. 17-22
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Zhu, J.S.1
Zou, D.Q.2
Liu, S.3
Benson, J.4
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12
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85025240220
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Technical Digest of the Third VLSI Packaging Workshop of Japan, Kyoto, Japan, Dec. 2-4
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Zhu, J. S., Zou, D., Dai, F., Liu, S., and Guo, Y. F., 1996d, “High Temperature Deformation of Area Array Packages by Moiré Interferometry/FEM Hybrid Method,” Technical Digest of the Third VLSI Packaging Workshop of Japan, Kyoto, Japan, Dec. 2-4.
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(1996)
High Temperature Deformation of Area Array Packages by Moiré Interferometry/Fem Hybrid Method
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Zhu, J.S.1
Zou, D.2
Dai, F.3
Liu, S.4
Guo, Y.F.5
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13
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0344951659
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High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry
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Zhu, J. S., Zou, D. Q., Dai, F. L., and Liu, S., 1997a, “High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry,”Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP), Vol. 1.
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(1997)
Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP)
, vol.1
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Zhu, J.S.1
Zou, D.Q.2
Dai, F.L.3
Liu, S.4
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14
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85025221374
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presented at the 9th Symposium on Mechanics of Surface Mount Assemblies, International Mechanical Engineering Congress, Dallas, Nov. 16-21
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Zhu, J. S., and Liu, S., 1997a, “Thermal Deformation and Stress Analysis of a Column Grid Array Package by Hybrid Moiré/FEM Method,” presented at the 9th Symposium on Mechanics of Surface Mount Assemblies, International Mechanical Engineering Congress, Dallas, Nov. 16-21.
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(1997)
Thermal Deformation and Stress Analysis of a Column Grid Array Package by Hybrid Moiré/FEM Method
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Zhu, J.S.1
Liu, S.2
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15
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85025200911
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presented at the International Mechanical Engineering Congress, Dallas, Nov. 16-21
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Zhu, J. S., Zou, D. Q., and Liu, S., 1997b, “Real Time Monitoring and Simulations of Thermal Deformations in Plastic Package,” presented at the International Mechanical Engineering Congress, Dallas, Nov. 16-21.
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(1997)
Real Time Monitoring and Simulations of Thermal Deformations in Plastic Package
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Zhu, J.S.1
Zou, D.Q.2
Liu, S.3
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