SCOPUS 정보 검색 플랫폼

Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 109-114

In situ fixed angle X-ray reflectivity study of sputter-deposited amorphous LaNiO3 thin film on Si substrate

(4) Lee, Chih Hao a Lee, Hsin Yi a,b Liang, K S b,c Wu, Tai Bor a

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

b NATIONAL SYNCHROTRON RADIATION RESEARCH CENTER (Taiwan)

c EXXONMOBIL UPSTREAM RESEARCH COMPANY (United States)

Author keywords

In situ deposition; LaNio3 thin film; X ray reflectivity

Indexed keywords

AMORPHOUS FILMS; COALESCENCE; DENSITY MEASUREMENT (SPECIFIC GRAVITY); ELECTROMAGNETIC WAVE REFLECTION; LANTHANUM COMPOUNDS; MAGNETRON SPUTTERING; SILICON WAFERS; SPUTTER DEPOSITION; SURFACE ROUGHNESS; THICKNESS MEASUREMENT; THIN FILMS; X RAY ANALYSIS;

FIXED ANGLE X RAY REFLECTIVITY ANALYSIS; LANTHANUM NIOBATE;

CONDUCTIVE FILMS;

EID: 0032094043 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4526(98)00213-0 Document Type: Article

Times cited : (8)

References (21)

1
- 0000991979
- A. Wold, B. Post, E. Banks, J. Am. Chem. Soc. 70 (1957) 4911.
- (1957) J. Am. Chem. Soc. , vol.70 , pp. 4911
- Wold, A.¹ Post, B.² Banks, E.³

2
- 5344243343
- H. Obayashi, T. Kudo, Jpn. J. Appl. Phys. 14 (1975) 330.
- (1975) Jpn. J. Appl. Phys. , vol.14 , pp. 330
- Obayashi, H.¹ Kudo, T.²

3
- 0026206017
- K.P. Rajeex, G.V. Shivakuma, A.K. Raychaudhmi, Solid State Commun. 79 (1991) 591.
- (1991) Solid State Commun. , vol.79 , pp. 591
- Rajeex, K.P.¹ Shivakuma, G.V.² Raychaudhmi, A.K.³

4
- 36449004207
- C.C. Yang, M.S. Chen, T.J. Hong, C.M. Wu, J.M. Wu, T.B. Wu, Appl. Phys. Lett. 66 (1995) 2643.
- (1995) Appl. Phys. Lett. , vol.66 , pp. 2643
- Yang, C.C.¹ Chen, M.S.² Hong, T.J.³ Wu, C.M.⁴ Wu, J.M.⁵ Wu, T.B.⁶

5
- 0000987254
- Hsin-Yi Lee, Tai-Bor Wu, Jyh-Fu Lee, J. Appl. Phys. 80 (4) (1996) 2175.
- (1996) J. Appl. Phys. , vol.80 , Issue.4 , pp. 2175
- Lee, H.-Y.¹ Wu, T.-B.² Lee, J.-F.³

6
- 0029342815
- M.J. Shyu, T.J. Hong, T.B. Wu, Jpn. J. Appl. Phys. 34 (1995) 3647.
- (1995) Jpn. J. Appl. Phys. , vol.34 , pp. 3647
- Shyu, M.J.¹ Hong, T.J.² Wu, T.B.³

7
- 0029309383
- M.J. Shyu, T.J. Hong, T.B. Wu, Mater. Lett. 23 (1995) 221.
- (1995) Mater. Lett. , vol.23 , pp. 221
- Shyu, M.J.¹ Hong, T.J.² Wu, T.B.³

8
- 0029371320
- M.S. Chen, J.M. Wu, T.B. Wu, Jpn. J. App. Phys. 34 (1995) 4870.
- (1995) Jpn. J. App. Phys. , vol.34 , pp. 4870
- Chen, M.S.¹ Wu, J.M.² Wu, T.B.³

9
- 0009286140
- M.S. Chen, T.B. Wu, J.M. Wu, J. Appl. Phys. 68 (1996) 1430.
- (1996) J. Appl. Phys. , vol.68 , pp. 1430
- Chen, M.S.¹ Wu, T.B.² Wu, J.M.³

10
- 0028262021
- T.B. Wu, T.J. Hong, M.C. Jiang, Mater. Chem. Phys. 36 (1994) 337.
- (1994) Mater. Chem. Phys. , vol.36 , pp. 337
- Wu, T.B.¹ Hong, T.J.² Jiang, M.C.³

11
- 0346989693
- in press
- Hsin-Yi Lee, Tai-Bor Wu, J. Mater. Res., in press.
- J. Mater. Res.
- Lee, H.-Y.¹ Wu, T.-B.²

12
- 0347620838
- in press
- C.H. Lee, S.Y. Tseng, J. Appl. Cryst. in press.
- J. Appl. Cryst.
- Lee, C.H.¹ Tseng, S.Y.²

13
- 0030562327
- C.H. Lee, S.Y. Tseng, Appl. Surf. Sci. 92 (1996) 282.
- (1996) Appl. Surf. Sci. , vol.92 , pp. 282
- Lee, C.H.¹ Tseng, S.Y.²

14
- 0005006441
- J.P. Chauvineau, Rev. Phys. Appl. 23 (1988) 1645.
- (1988) Rev. Phys. Appl. , vol.23 , pp. 1645
- Chauvineau, J.P.¹

15
- 4243413468
- H. You, R.P. Chiarello, H.K. Kim, K.G. Vandervoort, Phys. Rev. Lett. 70 (1993) 2900.
- (1993) Phys. Rev. Lett. , vol.70 , pp. 2900
- You, H.¹ Chiarello, R.P.² Kim, H.K.³ Vandervoort, K.G.⁴

16
- 0030563054
- H. You, K.G. Huang, R.T. Kampwirth, Physica B 221 (1996) 77.
- (1996) Physica B , vol.221 , pp. 77
- You, H.¹ Huang, K.G.² Kampwirth, R.T.³

17
- 26144449160
- L.G. Parratt, Phys. Rev. 95 (1954) 359.
- (1954) Phys. Rev. , vol.95 , pp. 359
- Parratt, L.G.¹

18
- 0000515073
- L. Nevot, P. Croce, Rev. Phys. Appl. 15 (1980) 761.
- (1980) Rev. Phys. Appl. , vol.15 , pp. 761
- Nevot, L.¹ Croce, P.²

19
- 4243979739
- M. Kardar, G. Parisi, Y.C. Zhang, Phys. Rev. Lett. 56 (1986) 889.
- (1986) Phys. Rev. Lett. , vol.56 , pp. 889
- Kardar, M.¹ Parisi, G.² Zhang, Y.C.³

20
- 44949288909
- F. Family, Physica A 168 (1990) 561.
- (1990) Physica A , vol.168 , pp. 561
- Family, F.¹

21
- 0003723452
- World Scientific, Singapore
- H.N. Yang, G.C. Wang, T.M. Lu, Diffraction from Rough Surfaces and Dynamic Growth Fronts, World Scientific, Singapore, 1992, p. 136.
- (1992) Diffraction from Rough Surfaces and Dynamic Growth Fronts , pp. 136
- Yang, H.N.¹ Wang, G.C.² Lu, T.M.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.