Applications of x-ray interferometer-generated Moiré patterns

Nanotechnology

Volumn 9, Issue 2, 1998, Pages 125-132

  Chetwynd, D G ^a   Krylova, N O ^a   Bryanston Cross, P J ^a   Wang, Z ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DATA PROCESSING; IMAGING TECHNIQUES; MOIRE FRINGES; X RAY MICROSCOPES;

FRINGE ANALYSIS ALGORITHMS; PHASE IMAGING; ULTRAPRECISION METROLOGY; X RAY INTERFEROMETER;

INTERFEROMETERS;

EID: 0032091461     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/9/2/015     Document Type: Article

References (14)

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