Phase-shifted image matching algorithm for displacement measurement

Optical Engineering

Volumn 35, Issue 8, 1996, Pages 2327-2332

  Wang, Zuobin ^a   Graça, Mario S ^a   Bryanston Cross, Peter J ^a   Whitehouse, David J ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Displacement measurement; Electrostatic force; Fringe pattern matching; Image matching; Interferometry; Mean square difference; Phase measurements

Indexed keywords

EID: 0001451667     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.600808     Document Type: Article

References (22)

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