Texture determination by energy-dispersive XRD

Physica B: Condensed Matter

Volumn 248, Issue 1-4, 1998, Pages 405-410

  Player, M A ^a   Shi, Z ^a   Clark, S M ^b   Miller, M C ^b   Tang, C C ^b  

^a UNIVERSITY OF ABERDEEN   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

Energy dispersive; Nickel; Texture; Thin film

Indexed keywords

CRYSTALLOGRAPHY; NICKEL; SYNCHROTRON RADIATION; TEXTURES; THIN FILMS;

ENERGY DISPERSIVE X RAY DIFFRACTION;

X RAY CRYSTALLOGRAPHY;

EID: 0032089504     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00272-5     Document Type: Article

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