Variation of preferred orientation of erbium thin films with temperature and substrate

Materials Science Forum

Volumn 228-231, Issue PART 2, 1996, Pages 469-474

  Craib, G R G ^a   Player, M A ^a   Rodman, M J ^a   Tang, C C ^b  

^a UNIVERSITY OF ABERDEEN   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

Author keywords

Erbium; Texture; Thin Film Materials

Indexed keywords

CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; GLASS; MOLYBDENUM; STRESSES; SUBSTRATES; TEMPERATURE; TEXTURES; THICKNESS MEASUREMENT; THIN FILMS; X RAY CAMERAS;

AUTOMATED POLE FIGURE CAMERA; ERBIUM THIN FILMS; POLE FIGURES; PREFERRED ORIENTATION;

ERBIUM;

EID: 0030397846     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.228-231.469     Document Type: Article

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