Assembly and analysis of quantum devices using SPM based methods

Microelectronics Reliability

Volumn 38, Issue 6-8, 1998, Pages 943-950

  Montelius, Lars ^a   Junno, T ^a   Carlsson, S B ^a   Magnusson, M H ^a   Deppert, K ^a   Xu, H ^a   Samuelson, L ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRON TUNNELING; SEMICONDUCTOR DEVICE STRUCTURES;

SINGLE ELECTRON TUNNELING (SET) EFFECTS;

QUANTUM ELECTRONICS;

EID: 0032083939     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00165-6     Document Type: Article

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