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Volumn , Issue , 1997, Pages 224-227
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Transition intensities and noise spectra in submicron MOSFETs
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENT DISTRIBUTION;
ELECTRIC POTENTIAL;
SPURIOUS SIGNAL NOISE;
DRAIN-SOURCE CURRENT;
RANDOM TELEGRAPH SIGNALS (RTS) NOISE;
MOSFET DEVICES;
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EID: 0031295713
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (3)
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