메뉴 건너뛰기




Volumn 38, Issue 6-8, 1998, Pages 1319-1323

Advanced IGBT modules for railway traction applications: Reliability testing

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC RAILROADS; ELECTRIC TRACTION; GATES (TRANSISTOR); RELIABILITY; SEMICONDUCTOR DEVICE TESTING; THERMAL CYCLING; THERMOANALYSIS;

EID: 0032083762     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(98)00150-4     Document Type: Article
Times cited : (59)

References (16)
  • 4
    • 0001826993 scopus 로고
    • Reliability Testing and Analysis of IGBT-Power Semiconductor Modules
    • Jacob, P.; Held, M.; Scacco, P.; Wu, W.: Reliability Testing and Analysis of IGBT-Power Semiconductor Modules, Proc. 20st ISTFA, (1994)
    • (1994) Proc. 20st ISTFA
    • Jacob, P.1    Held, M.2    Scacco, P.3    Wu, W.4
  • 6
    • 0029190556 scopus 로고
    • Investigation on the Long Term Reliability of Power IGBT Modules
    • Wu, W.; Held, M.; Jacob, P.; Scacco, P.; Birolini, A.: Investigation on the Long Term Reliability of Power IGBT Modules, Proc. ISPSD 95 (1995), pp. 443-448
    • (1995) Proc. ISPSD , vol.95 , pp. 443-448
    • Wu, W.1    Held, M.2    Jacob, P.3    Scacco, P.4    Birolini, A.5
  • 7
    • 0342330323 scopus 로고    scopus 로고
    • Investigations on the Damage Mechanism of Aluminium Wire Bonds Used for High Power Applications
    • Poech, M.-H..; Dittmer, KJ.; Gäbisch, D.: Investigations on the Damage Mechanism of Aluminium Wire Bonds Used for High Power Applications, Proc. EUPAC 96 (1996), pp. 128-131
    • (1996) Proc. EUPAC , vol.96 , pp. 128-131
    • Poech, M.-H.1    Dittmer, K.J.2    Gäbisch, D.3
  • 8
    • 0030652545 scopus 로고    scopus 로고
    • Fast Power Cycling Test for IGBT Modules in Traction Application
    • Held, M.; Jacob, P.; Nicoletti, G.; Scacco, P.; Poech, M.-H.: Fast Power Cycling Test for IGBT Modules in Traction Application, Proc. PEDS 97 (1997), pp. 425-430
    • (1997) Proc. PEDS , vol.97 , pp. 425-430
    • Held, M.1    Jacob, P.2    Nicoletti, G.3    Scacco, P.4    Poech, M.-H.5
  • 9
    • 0031378688 scopus 로고    scopus 로고
    • Power-Cycling-Stability of IGBT-Modules
    • New Orleans, October 5-9
    • Auerbach, F.: Power-Cycling-Stability of IGBT-Modules. Proc. IEEE IAS, New Orleans, October 5-9 (1997)
    • (1997) Proc. IEEE IAS
    • Auerbach, F.1
  • 10
    • 0009026033 scopus 로고    scopus 로고
    • Multichip High Power IGBT-Modules for Traction and Industrial Application
    • Trondheim, Norway, September 22-24
    • Sommer, K.H.; Spanke, R.; Lefranc, G.; Göttert, J.: Multichip High Power IGBT-Modules for Traction and Industrial Application, Proc. EPE' 97, Trondheim, Norway, September 22-24, pp. 512-515
    • Proc. EPE' 97 , pp. 512-515
    • Sommer, K.H.1    Spanke, R.2    Lefranc, G.3    Göttert, J.4
  • 11
    • 0002534367 scopus 로고    scopus 로고
    • Reliability of High Power IGBT- Modules Testing on Thermal Fatigue Effects due to Traction Cycles
    • Trondheim
    • Hamidi, A.; Coquery, G.; Lallemand, R.: Reliability of High Power IGBT- Modules Testing on Thermal Fatigue Effects due to Traction Cycles: Proc. EPE '97, Trondheim
    • Proc. EPE '97
    • Hamidi, A.1    Coquery, G.2    Lallemand, R.3
  • 15
    • 0031246424 scopus 로고    scopus 로고
    • Substrate-To-Base Solder Joint Reliability in High Power IGBT Modules, Microelectronics and Reliability
    • Herr, E.; Frey, T.; Schlegel, R.; Stuck, A.; Zehringer, R.: Substrate-To-Base Solder Joint Reliability in High Power IGBT Modules, Microelectronics and Reliability, Special Issue ESREF 97 (1997), pp. 1719-1722
    • (1997) ESREF , vol.97 , Issue.SPEC. ISSUE , pp. 1719-1722
    • Herr, E.1    Frey, T.2    Schlegel, R.3    Stuck, A.4    Zehringer, R.5
  • 16
    • 0025661855 scopus 로고    scopus 로고
    • Evolution of VLSI Reliability Engineering
    • Brite EuRam BE 95-2105 RAPSDRA: Reliability of Advanced Power Semiconductors for Railway Traction Applications
    • Crook, D.L.: Evolution of VLSI Reliability Engineering. Proc. of IRPS 1990, pp. 2-11 Brite EuRam BE 95-2105 RAPSDRA: Reliability of Advanced Power Semiconductors for Railway Traction Applications
    • Proc. of IRPS 1990 , pp. 2-11
    • Crook, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.