Characterization of CuIn(Ga)Se2 thin films I. Cu-Rich layers

Physica Status Solidi (A) Applied Research

Volumn 167, Issue 1, 1998, Pages 131-142

  Wegher, M T ^a,c   Dirnstorfer, I ^a   Hoemann, D M ^a   Lampert, M D ^b   Karg, F ^b   Meyer, B K ^a  

^a JUSTUS LIEBIG UNIVERSITY   (Germany)

^b SHELL GLOBAL SOLUTIONS INTERNATIONAL B V   (United States)

^c LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BINDING ENERGY; COPPER COMPOUNDS; ELECTRIC CONDUCTIVITY OF SOLIDS;

DONOR ACCEPTOR PAIR RECOMBINATION MODEL;

THIN FILMS;

EID: 0032074798     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1521-396x(199805)167:1<131::aid-pssa131>3.0.co;2-f     Document Type: Article

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