Electrical characterization of chemically deposited CdS thin films under magnetic field application

Physica Status Solidi (A) Applied Research

Volumn 167, Issue 1, 1998, Pages 143-150

  Vigil, O ^a,b   Zelaya Angel, O ^a   Rodriguez Y ^b   Morales Acevedo, A ^a  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b UNIVERSITY OF HAVANA   (Cuba)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL GROWTH; DEPOSITION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC PROPERTIES; FILM GROWTH; GLASS; MAGNETIC FIELD EFFECTS; SUBSTRATES; THIN FILMS;

CHEMICAL BATH DEPOSITION (CBD);

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0032072201     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199805)167:1<143::AID-PSSA143>3.0.CO;2-3     Document Type: Article

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