Effect of residual stress on the stability of gold thin film surfaces

Materials and Manufacturing Processes

Volumn 13, Issue 3, 1998, Pages 445-453

  Aguilar, M ^a   Oliva, A I ^b   Quintana, P ^b  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

^b DEPARTAMENTO DE FÍSICA APLICADA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; DIFFUSION IN SOLIDS; ELECTRIC CURRENTS; ELECTROMIGRATION; FILM GROWTH; GOLD; RESIDUAL STRESSES; SCANNING TUNNELING MICROSCOPY; STRAIN; STRESS ANALYSIS; SURFACE ROUGHNESS; THIN FILMS;

SURFACE TOPOGRAPHY;

METALLIC FILMS;

EID: 0032066078     PISSN: 10426914     EISSN: None     Source Type: Journal    
DOI: 10.1080/10426919808935261     Document Type: Article

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