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Volumn 227-230, Issue PART 1, 1998, Pages 23-28

Recent developments in hot wire amorphous silicon

Author keywords

Amorphous silicon; Chemical vapor deposition; Internal friction

Indexed keywords

AMORPHOUS FILMS; CHEMICAL VAPOR DEPOSITION; COMPOSITION EFFECTS; ELECTRON BEAMS; FREEZING; HYDROGENATION; INTERNAL FRICTION; THERMAL EFFECTS;

EID: 0032065211     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(98)00327-5     Document Type: Article
Times cited : (16)

References (30)
  • 8
    • 0346182511 scopus 로고    scopus 로고
    • E.A. Schiff, M. Hack, A. Madan, M. Powell, A. Matsuda (Eds.), Materials Research Society, San Francisco, CA, in press
    • A.M. Mahan, D. Williamson, in: E.A. Schiff, M. Hack, A. Madan, M. Powell, A. Matsuda (Eds.), Proceedings of the Mater. Res. Symp. Proc., Materials Research Society, San Francisco, CA, 1997, in press.
    • (1997) Proceedings of the Mater. Res. Symp. Proc.
    • Mahan, A.M.1    Williamson, D.2
  • 10
    • 0021564913 scopus 로고
    • Magnetic Resonance Measurements in Hydrogenated Amorphous Silicon
    • J.I. Pankove (Ed.), Academic Press, New York
    • P.C. Taylor, Magnetic Resonance Measurements in Hydrogenated Amorphous Silicon, in: J.I. Pankove (Ed.), Semiconductors and Semimetals, Vol. 21C, Academic Press, New York, 1984, p. 99.
    • (1984) Semiconductors and Semimetals , vol.21 C , pp. 99
    • Taylor, P.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.