Implantation-induced structural and surface modification of silica

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 141, Issue 1-4, 1998, Pages 629-633

  Johnson, C M ^a   Thompson, T D ^a   Ridgway, M C ^a   Gurarie, V ^b  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

Cracking; EXAFS; Ion implantation; Silica; SiO2

Indexed keywords

CARBON; CHEMICAL BONDS; CRACK INITIATION; DENSITY (SPECIFIC GRAVITY); ION BOMBARDMENT; ION IMPLANTATION; RADIATION EFFECTS; REFRACTIVE INDEX; SATURATION (MATERIALS COMPOSITION); SURFACE STRUCTURE; SURFACE TREATMENT; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; PROFILOMETRY;

SILICA;

EID: 0032065001     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(98)00145-1     Document Type: Article

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