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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 5 SUPPL. B, 1998, Pages 3128-3131

Some new applications of the scanning electron acoustic microscope for materials evaluation

(4) Jiang, Fuming a Kojima, Seiji a Zhang, Bingyang b Yin, Qingrui b

a UNIVERSITY OF TSUKUBA (Japan)

b SHANGHAI INSTITUTE OF CERAMICS (China)

Author keywords

Dislocation; Domains; Ferroelectric; Residual stress; Scanning electron acoustic microscope

Indexed keywords

ALUMINUM; CERAMIC MATRIX COMPOSITES; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); FERROELECTRIC MATERIALS; HETEROJUNCTIONS; MATERIALS TESTING; MULTILAYERS; RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM COMPOUNDS; STRESS CONCENTRATION;

DOMAIN STRUCTURE; SCANNING ELECTRON ACOUSTIC MICROSCOPE; VICKER INDENTATION;

ACOUSTIC MICROSCOPES;

EID: 0032064555 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.37.3128 Document Type: Review

Times cited : (15)

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