Piezoelectric electron acoustic microscopy and some applications to materials analysis

Ferroelectrics

Volumn 196, Issue 1-4, 1997, Pages 229-232

  Jiang, Fuming ^a   Hui, Sengxing ^a   Zhang, Bingyang ^a   Yin, Qingrui ^a  

^a SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMAGING; PIEZOELECTRIC DEVICES; SCANNING ELECTRON MICROSCOPY; STRESS CONCENTRATION;

SCANNING ELECTRON ACOUSTIC MICROSCOPY (SEAM);

ACOUSTIC MICROSCOPES;

EID: 0030681962     PISSN: 00150193     EISSN: None     Source Type: Journal    
DOI: 10.1080/00150199708224168     Document Type: Article

References (5)

1. Cargill G S III, 1980 Nature 286, 691
2. Brandis E and Rosencwaig A 1980, Appl. Phys. Lett. 37 98
3. Yin, Qingrui, etc., Ferroelectrics, 1994, Vol 151 97-102
4. L.J. Balk, Advances in Electron and Electron Physics, Vol 71, 1
5. Davies D.G 1986 Phil. Trans. R. Soc. A 320 243