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Volumn 10, Issue 4, 1998, Pages 601-606
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Microstructural characterization of amorphous SiO2 wrapped β-SiC nanowhiskers
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
COMPOSITE MATERIALS;
CRYSTAL MICROSTRUCTURE;
CRYSTAL WHISKERS;
NANOSTRUCTURED MATERIALS;
REDUCTION;
SCANNING ELECTRON MICROSCOPY;
SILICON CARBIDE;
TRANSMISSION ELECTRON MICROSCOPY;
CARBOTHERMAL REDUCTION;
NANOWHISKERS;
SILICA;
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EID: 0032058091
PISSN: 09659773
EISSN: None
Source Type: Journal
DOI: 10.1016/S0965-9773(98)00099-3 Document Type: Article |
Times cited : (4)
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References (20)
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