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Volumn 10, Issue 4, 1998, Pages 601-606

Microstructural characterization of amorphous SiO2 wrapped β-SiC nanowhiskers

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; COMPOSITE MATERIALS; CRYSTAL MICROSTRUCTURE; CRYSTAL WHISKERS; NANOSTRUCTURED MATERIALS; REDUCTION; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032058091     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(98)00099-3     Document Type: Article
Times cited : (4)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.