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Nanostructured Materials

Volumn 10, Issue 4, 1998, Pages 649-660

TEM characterization of nanodiamond thin films

(4) Qin, L C a Zhou, D a Krauss, A R a Gruen, D M a

a IBM (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL MICROSTRUCTURE; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; FILM GROWTH; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; NANOSTRUCTURED MATERIALS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

BRIGHT FIELD ELECTRON MICROSCOPY; NANODIAMOND THIN FILMS; PARALLEL ELECTRON ENERGY LOSS SPECTROSCOPY; SELECTED AREA ELECTRON DIFFRACTION;

DIAMOND FILMS;

EID: 0032058066 PISSN: 09659773 EISSN: None Source Type: Journal
DOI: 10.1016/S0965-9773(98)00092-0 Document Type: Article

Times cited : (79)

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