Grain boundaries and grain size distributions in nanocrystalline diamond films derived from fulterene precursors

Solid State Phenomena

Volumn 51-52, Issue , 1996, Pages 261-270

  Csencsits, R ^a   Zuiker, C D ^a   Gruen, D M ^a   Krauss, A R ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Diamond; Fullerenes; Grain boundary; Nanocrystalline; TEM

Indexed keywords

EID: 17544380993     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (7)

1. J. S. Luo, D. M. Gruen, A. R. Krauss, X. Z. Pan, and S. Z. Liu, "High Resolution Transmission Electron Microscopy Study of Diamond Films Grown from Fullerene Precursors," submitted for the Proceedings of the Symposium on The Fullerenes: Chemistry, Physics, and New Directions. 187th Meeting of the Electrochemical Society, Reno, Nevada, May 21-26, 1995 (in press).
2. D. M. Gruen, S. Liu, A. R. Krauss, and X. Pan, J. Appl. Phys. 75, 1758 (1994).
3. D. M. Gruen, S. Liu, A. R. Krauss, J. Luo, and X. Pan, Appl. Phys. Lett. 64, 1502 (1994).
4. C. D. Zuiker, D. M. Gruen, and A. R. Krauss, MRS Bulletin XX(5), 29 (1995).
5. D. Wolf and S. Phillpot, private communication.
6. Specimen Preparation for Transmission Electron Microscopy of Materials II, ed. by R. M. Anderson, B. Tracy, and J. C. Bravman, Mat. Res. Soc. Symp. Proc. 254 (1992).
7. R. S. Burlington and D. C. May, Jr.: In Handbook of Probability and Statistics with Tables. 2nd edition (McGraw-Hill Book Co., New York 1970), p. 183.