Improvements to X-ray laminography for automated inspection of solder joints

IEEE transactions on components, packaging and manufacturing technology. Part C. Manufacturing

Volumn 21, Issue 2, 1998, Pages 148-154

  Sankaran, Vijay ^a   Kalukin, Andrew R ^a   Kraft, Russell P ^a  

^a SEMATECH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; IMAGE RECONSTRUCTION; INSPECTION; NEURAL NETWORKS; SOLDERED JOINTS; VISUALIZATION; X RAY ANALYSIS;

AUTOMATED INSPECTION; X RAY LAMINOGRAPHY;

ELECTRONICS PACKAGING;

EID: 0032048753     PISSN: 10834400     EISSN: None     Source Type: Journal    
DOI: 10.1109/3476.681394     Document Type: Article

References (16)

1. V. Sankaran A methodology for integrated inspection of printed wiring assemblies using neural networks Aug. 1996 Ph.D. dissertation NY, Troy
2. H. H. Barrett W. Swindell Radiological Imaging. 2 1981 Academic New York
3. W. H. Press B. P. Flannery S. A. Teutolsky W. T. Vetterling Numerical Recipes: The Art of Scientific Programming. 1986 Cambridge Univ. Press U.K., Cambridge
4. G. Leinbach S. Rooks Process variation evaluation via X-ray laminography Surface Mount Technol. 38 40 Apr. 1995
5. J. A. Adams Inspection of ball grid array assembly Ball Grid Array Technology. 465 489 1995 McGraw-Hill New York
6. M. Moganti C. H. Dagli F. Ercal PCB inspection using competitive learning and fuzzy associative memories Intelligent Engineering Systems through Artificial Neural Networks. 421 426 1994 ASME
7. C. Neubauer R. Hanke Improving X-ray inspection of printed circuit boards by integration of neural network classifiers Proc. IEEE/CHMT Int. Electron. Manufact. Technol. Symp. 14 18 1993 3174 8999 398228
8. S. Jagannathan D. Seebaluck J. D. Jenness Intelligent inspection of wave soldered joints J. Manufact. Syst. 11 2 137 143 1992
9. V. Sankaran B. Chartrand D. L. Millard M. J. Embrechts R. P. Kraft Automated inspection of solder joints̵A neural network approach Proc. 1995 IEMT Symp. 232 237 Oct. 1995 4023 11545 526120
10. E. Parzen On estimation of a probability density function and mode Ann. Math. Stat. 33 1065 1076 1962
11. A. C. Kak M. Slaney Principles of Computerized Tomographic Imaging. 275 296 1987 IEEE Press New York
12. A. R. Kalukin V. Sankaran Three-dimensional visualization of multilayered assemblies using X-ray laminography IEEE Trans. Comp., Packag., Manufact. Technol. 20 361 366 Sept. 1997 95 13548 623031
13. S. M. Rooks B. Benhabib K. C. Smith Development of an inspection process for ball-grid-array technology using scanned-beam X-ray laminography IEEE Trans. Comp., Packag., Manufact. Technol. 18 851 861 Dec. 1995 95 10163 477473
14. A. Delopoulos A. Tirakis S. Kollias Invariant image classification using triple-correlation-based neural networks IEEE Trans. Neural Networks 5 392 408 May 1994 72 7144 286911
15. N. Murphy K. Lodge Automatic feature set selection using the modified Karhunen̵Loeve transform: Industrial application in visual inspection SPIE 2064 264 275 1993
16. D. F. Specht Probabilistic neural networks for classification, mapping, or associative memory Proc. IEEE Int. Conf. Neural Networks 1 525 532 1988 763 907 23887