Narrow pitch tracking using optical head for recording with atomic force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 4 SUPPL. B, 1998, Pages 2271-2273

  Nakamura, Kimio ^a   Koyanagi, Hajime ^a   Hosaka, Sumio ^a  

^a HITACHI LTD   (Japan)

Author keywords

Atomic force microscope (AFM); Force modulation recording; High density recording; Optical head; Polycarbonate disk; Tracking control

Indexed keywords

ATOMIC FORCE MICROSCOPY; ERROR ANALYSIS; MAGNETIC HEADS; OPTICAL RECORDING; READOUT SYSTEMS; SIGNAL DETECTION;

FORCE RECORDING MODULATION METHODS; OPTICAL HEADS;

OPTICAL DISK STORAGE;

EID: 0032046868     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.2271     Document Type: Article

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