How the surface resistance Rs of patterned high-Tc superconducting thin film is affected by the film's edge

Journal of Superconductivity

Volumn 11, Issue 2, 1998, Pages 291-296

  Jin, B B ^a   Wu, R X ^b  

^a NANJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

^b NANJING UNIVERSITY   (China)

Author keywords

Critical current; Penetration depth; Surface impedance of high Tc superconductor; Thin films

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; ELECTRIC RESISTANCE; MICROSTRIP DEVICES; RESONATORS; SUPERCONDUCTING FILMS; THICKNESS MEASUREMENT; THIN FILMS; COMPUTATIONAL METHODS; HIGH TEMPERATURE SUPERCONDUCTORS; MAGNETIC FIELD EFFECTS; MICROWAVES; SURFACE STRUCTURE;

MAGNETIC PENETRATION DEPTH; MICROSTRIP RESONATORS; SURFACE IMPEDANCE; LONDON EQUATION; MICROWAVE SURFACE RESISTANCE;

HIGH TEMPERATURE SUPERCONDUCTORS; SUPERCONDUCTING FILMS;

EID: 0032046681     PISSN: 08961107     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1022696220632     Document Type: Article

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