Resolution of an optical image of a scanning near-field optical/atomic force microscope as a function of sample-probe distance during synchronized irradiation

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 331-334

  Chiba, Norio ^a   Muramatsu, Hiroshi ^a   Nakajima, Kunio ^a   Homma, Katsunori ^a   Ataka, Tatsuaki ^a   Fujihira, Masamichi ^b  

^a SEIKO INSTRUMENTS INC   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Atomic force microscopy; Optical properties; Scanning tunnelling microscopy; Surface morphology

Indexed keywords

IRRADIATION; LIGHT MODULATION; MORPHOLOGY; OPTICAL FIBERS; OPTICAL PROPERTIES; OPTIMIZATION; PHASE SHIFTERS; SCANNING TUNNELING MICROSCOPY; SURFACES; SYNCHRONIZATION;

OPTICAL IMAGE RESOLUTION; SAMPLE PROBE DISTANCE; SCANNING NEAR FIELD OPTICAL ATOMIC FORCE MICROSCOPE; SYNCHRONIZED IRRADIATION; TOPOGRAPHY;

ATOMIC FORCE MICROSCOPY;

EID: 0030080598     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06797-3     Document Type: Article

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