Critical analysis of weighting functions for the deep level transient spectroscopy of semiconductors

Measurement Science and Technology

Volumn 9, Issue 3, 1998, Pages 477-484

  Istratov, A A ^a   Vyvenko, O F ^b   Hieslmair, H ^a   Weber, E R ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONS; SEMICONDUCTOR MATERIALS; SIGNAL TO NOISE RATIO;

FIGURE OF MERIT; WEIGHTING FUNCTIONS;

DEEP LEVEL TRANSIENT SPECTROSCOPY;

EID: 0032028240     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/9/3/023     Document Type: Article

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