New correlation procedure for the improvement of resolution of deep level transient spectroscopy of semiconductors

Journal of Applied Physics

Volumn 82, Issue 6, 1997, Pages 2965-2968

  Istratov, A A ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b ST PETERSBURG STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CORRELATION METHODS; FUNCTIONS; INTEGRAL EQUATIONS; INVERSE PROBLEMS; LAPLACE TRANSFORMS; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS;

CORRELATION FUNCTIONS; GAVER-STEHFEST ALGORITHM; INVERSE LAPLACE TRANSFORMATION; WEIGHTING FUNCTIONS;

DEEP LEVEL TRANSIENT SPECTROSCOPY;

EID: 0031223565     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366269     Document Type: Article

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