High-resolution studies of grain boundary structure in yttria-stabilized cubic zirconia thin films grown by MOCVD

Physica Status Solidi (A) Applied Research

Volumn 166, Issue 1, 1998, Pages 73-89

  Merkle, K L ^a   Bai, G R ^a   Li, Z ^a   Song, C Y ^a   Thompson, L J ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL ATOMIC STRUCTURE; CRYSTAL GROWTH; CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); FILM GROWTH; GRAIN BOUNDARIES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; POLYCRYSTALLINE MATERIALS; TEXTURES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

FRESNEL CONTRAST; LOW INDEX PLANES;

ZIRCONIA;

EID: 0032026409     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199803)166:1<73::AID-PSSA73>3.0.CO;2-B     Document Type: Article

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