The formation, transport properties and microstructure of 45° [001] grain boundaries induced by epitaxy modification in YBa2Cu3O7-x thin films

Physica C: Superconductivity and its Applications

Volumn 270, Issue 1-2, 1996, Pages 75-90

  Vuchic, B V ^a   Merkle, K L ^a   Baldo, P M ^a   Dean, K A ^b   Buchholz, D B ^b   Chang, R P H ^b   Zhang, H ^b   Marks, L D ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

Critical current density; Electrical resistivity; Grain boundaries; HREM; Thin films

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; ELECTRON MICROSCOPY; EPITAXIAL GROWTH; ION IMPLANTATION; MAGNESIA; OXIDE SUPERCONDUCTORS; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; TRANSPORT PROPERTIES;

EPITAXY MODIFICATION; MICROORIENTATION; PULSED ORGANOMETALLIC BEAM EPITAXY;

GRAIN BOUNDARIES;

EID: 0043095272     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4534(96)00481-9     Document Type: Article

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