On the operational and manufacturing tolerances of GaAs-AlAs MQW modulators

IEEE Journal of Quantum Electronics

Volumn 34, Issue 3, 1998, Pages 431-438

  Goossen, K W ^a,b   Cunningham, J E ^a   Jan, W Y ^a   Leibenguth, R ^a  

^a LUCENT TECHNOLOGIES   (United States)

^b IEEE   (United States)

Author keywords

Electrooptic materials devices; Electrooptic modulation; Integrated optoelectronics; Optical interconnections; Quantum well devices

Indexed keywords

ERRORS; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED OPTOELECTRONICS; INTERPOLATION; LIGHT INTERFERENCE; LIGHT REFLECTION; OPTICAL INTERCONNECTS; OPTIMIZATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DIODES; SEMICONDUCTOR QUANTUM WELLS; TEMPERATURE;

CONTRAST RATIO; FABRY-PEROT FRINGES; OPERATIONAL TOLERANCES;

LIGHT MODULATORS;

EID: 0032024515     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.661450     Document Type: Article

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