Scanning tunneling and atomic force microscopy study of the misfit layer compounds (LaS)1.14(NbS2)n (n = 1, 2) and [(Pb,Sb)S]1.14NbS2

Surface Science

Volumn 400, Issue 1-3, 1998, Pages 266-276

  Bengel, H ^a   Jobic, S ^a   Deudon, C ^a   Rouxel, J ^a   Seo, D K ^b   Whangbo, M H ^b  

^a INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy; Image simulations; Misfit layered compounds; Scanning tunneling microscopy; Sulphides; Surface defects; Surface structure, morphology, roughness, and topography

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; DEFECTS; IMAGE ANALYSIS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SULFUR COMPOUNDS; SURFACE ROUGHNESS;

MISFIT LAYER COMPOUNDS; SURFACE TOPOGRAPHY;

NIOBIUM COMPOUNDS;

EID: 0032022551     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00882-0     Document Type: Article

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