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Volumn 136-138, Issue , 1998, Pages 623-627

Simulation of surface roughness effects in ERDA

Author keywords

Elastic recoil detection; Ion beam analysis; Simulation; Surface roughness

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; IODINE; ION BEAMS; REACTIVE ION ETCHING; SILICON WAFERS;

EID: 0032021239     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00860-4     Document Type: Article
Times cited : (32)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.