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Volumn 136-138, Issue , 1998, Pages 623-627
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Simulation of surface roughness effects in ERDA
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Author keywords
Elastic recoil detection; Ion beam analysis; Simulation; Surface roughness
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Indexed keywords
ALGORITHMS;
COMPUTER SIMULATION;
IODINE;
ION BEAMS;
REACTIVE ION ETCHING;
SILICON WAFERS;
ELASTIC RECOIL DETECTION ANALYSIS (ERDA);
ION BEAM ANALYSIS (IBA);
SURFACE ROUGHNESS;
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EID: 0032021239
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00860-4 Document Type: Article |
Times cited : (32)
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References (14)
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