Simulation of RBS spectra for a surface with a periodic roughness

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 117, Issue 1-2, 1996, Pages 161-169

  Itoh, Y ^a,b   Maeda, T ^a   Nakajima, T ^a   Kitamura, A ^a   Ogiwara, N ^c   Saidoh, M ^c  

^a KOBE UNIVERSITY OF MERCANTILE MARINE   (Japan)

^b Nihon Medi Physics   (Japan)

^c JAPAN ATOM ENER RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DIFFRACTION GRATINGS; IONS; LEAD; MICROSTRUCTURE; PARTICLE ACCELERATORS; PARTICLE DETECTORS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS;

HEAVY IONS; LEAD THIN FILMS; PERIODIC ROUGHNESS; SPECTRAL SHAPE; SURFACE COMPONENT;

RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 0030213681     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00224-8     Document Type: Article

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