High energy resolution PIXE analysis using focused MeV heavy ion beams

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 368-372

  Mokuno, Y ^a   Horino, Y ^a   Tadic T ^a,c   Terasawa, M ^b   Sekioka, T ^b   Chayahara, A ^a   Kinomura, A ^a   Tsubouchi, N ^a   Fujii, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF HYOGO   (Japan)

^c RUDER BO KOVI INSTITUTE   (Croatia)

Author keywords

Heavy ion microbeam; High energy resolution PIXE

Indexed keywords

ION BEAMS; ION BOMBARDMENT; PROTONS; SILICA; SILICON; SPECTROMETERS; X RAY SPECTROSCOPY;

CRYSTAL SPECTROMETER; ENERGY DISPERSIVE X RAY SPECTROSCOPY (EDS); HEAVY ION MICROBEAMS; PARTICLE INDUCED X RAY EMISSION (PIXE);

NUCLEAR INSTRUMENTATION;

EID: 0032017480     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00708-8     Document Type: Article

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