High energy resolution PIXE with high efficiency using the heavy ion microbeam

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 130, Issue 1-4, 1997, Pages 243-246

  Mokuno, Y ^a   Horino, Y ^a   Chayahara, A ^a   Kinomura, A ^a   Tsubouchi, N ^a   Fujii, K ^a   Terasawa, M ^b   Sekioka, T ^b   Mitamura, T ^b  

^a OSAKA NATIONAL RESEARCH INSTITUTE   (Japan)

^b UNIVERSITY OF HYOGO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; ION BEAMS; PROPORTIONAL COUNTERS; PROTONS; SILICON; TITANIUM; X RAY ANALYSIS;

HEAVY ION MICROBEAM; PARTICLE INDUCED X RAY EMISSION (PIXE); X RAY CRYSTAL SPECTROMETERS;

X RAY SPECTROMETERS;

EID: 0031549052     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00171-7     Document Type: Article

References (10)

1. M. Terasawa, Int. J. PIXE 1 (1991) 251.
2. D.H. Morse, G.S. Bench, S.P.H.T. Freeman, A.E. Pontau, Nucl. Instr. and Meth. B 99 (1995) 427.
3. B.L. Doyle, U. Schiebel, L.D. Ellsworth, J.R. Macdonald, Rev. Sci. Instrum. 49 (1978) 760.
4. B.L. Doyle, R.D. Willis, R.L. Walter, S.M. Shafroth, Nucl. Instr. and Meth. 142 (1977) 317.
5. H. Hamanaka, M. Ohura, Y. Yamamoto, S. Morita, K. Iwamura, Nucl. Instr. and Meth. B 35 (1988) 75.
6. K. Ishii, H. Hamanaka, S. Morita, M. Ohura, Y. Yamamoto, Y. Awaya, Vacuum 39 (1989) 97.
7. Y. Horino, A. Chayahara, M. Kiuchi, K. Fujii, M. Satou, F. Fujimoto, Jpn. J. Appl. Phys. 29 (1990) 1230.
8. V. Perez-Mendez, K. Valentine, Nucl. Instr, and Meth. 106 (1973) 397.
9. H. Hamanaka, M. Okane, Y. Yamamoto, Nucl. Instr. and Meth. B 45 (1990) 360.
10. J.D. Garcia, R.J. Fortner, T.M. Kavanagh, Rev. Mod. Phys. 45 (1973) 111.