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Volumn 8, Issue 1, 1998, Pages 18-19

X-ray rietveld structure refinement of ErNiSb

Author keywords

Rietveld analysis; Structure refinement; X ray powder diffraction

Indexed keywords

CRYSTAL STRUCTURE; X RAY ANALYSIS; CRYSTAL ORIENTATION; X RAY POWDER DIFFRACTION;

EID: 0032008497     PISSN: 10036326     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (6)
  • 3
    • 33747915363 scopus 로고    scopus 로고
    • 9006 and DBWS-9006PC. School of Physics, Georgia Institute of Technology, Atlanta, U.S.A.
    • Sakthivel A, Young R A. User's Guide to Programs DBWS-9006 and DBWS-9006PC. School of Physics, Georgia Institute of Technology, Atlanta, U.S.A.
    • Young R A. User's Guide to Programs DBWS
    • Sakthivel, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.