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Volumn 26, Issue , 1982, Pages 1-10
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ACCURACY IN ANGLE AND INTENSITY MEASUREMENTS IN X-RAY POWDER DIFFRACTION.
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTERIZED AUTOMATION;
INTENSITY MEASUREMENTS;
POWDER DIFFRACTION PROFILES;
PROFILE FITTING;
SPECTRAL STRIPPING;
CRYSTALS;
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EID: 0020239033
PISSN: 03760308
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1154/s0376030800012222 Document Type: Conference Paper |
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Times cited : (16)
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References (0)
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