Complete high-frequency measurement of Mueller matrices based on a new coupled-phase modulator

Review of Scientific Instruments

Volumn 68, Issue 7, 1997, Pages 2671-2680

  Compain, Eric ^a   Drevillon, Bernard ^a  

^a LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001571398     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148178     Document Type: Article

References (45)

1. P. S. Hauge Surf Sci. 96, 108 (1980).
2. B. Drevillon Prog. Cryst. Growth Charact. Mater. 27, 1 (1993).
3. M. Schubert and B. Rheiländer, J. Opt. Soc. Am. A 13, 875 (1996).
4. C. F. Bohren and D. R. Huffman, Absorption and Scattering of Light by Small Particles (Wiley-Interscience, New York, 1983).
5. W. S. Bickel and W. M. Bailey, Am. J. Phys. 53, 468 (1984)).
6. R. M. Azzam. Opt. Lett. 2, 148 (1978).
7. P. S. Hauge, J. Opt. Soc. Am. 68, 1519 (1978).
8. D. H. Goldstein Appl. Opt. 31, 6676 (1992).
9. R. C. Thompson, J. R. Bottiger, and E. S. Fry, Appl. Opt. 19, 1323 (1980).
10. W. M. McClain, W. H. Jeng, B. Pati, Y. Shi, and D. Tian, Appl. Opt. 33, 1230 (1994)
11. A. J. Hunt and D. R. Huffman, Rev. Sci. Instrum. 44, 1753 (1973).
12. R. J. Perry A. J. Hunt and D. R. Huffman, Appl. Opt. 17, 2700 (1978).
13. R. Anderson, Appl. Opt. 31, 11 (1992).
14. B. W. Bell, Opt. Eng. (Bellingham) 28, 114 (1989).
15. R. M. A Azzam Opt. Acta 29, 685 (1982).
16. R. M. A. Azzam and K. A. Giardina, J. Opt. Soc. Am. A 10, 1190 (1993).
17. R. M. A. Azzam, United States Patent Appl. No. 859, 817.
18. Y. Cui and R. M. Azzam, Opt. Lett. 21, 89 (1996).
19. G. E. Jellison, Opt. Lett. 12, 766 (1987).
20. R. M. Azzam, Opt. Lett. 10, 309 (1985).
21. R. M. Azzam, E. Masetti, I. M. Elminyawi, and F. G. Grosz, Rev. Sci. Instrum. 59, 84 (1988).
22. R. M. Azzam, I. M. Elminyawi, and A. L. El-Saba, J. Opt. Soc. Am. A 5, 681 (1998).
23. R. M. Azzam and A. G. Lopez, J. Opt. Soc. Am. A 6, 1513 (1989).
24. S. Krishnan, J. Opt. Soc. Am. A 9, 1615 (1992).
25. S. Krishnan and P. C. Nordine, Appl. Opt. 33, 4184 (1994).
26. S. Huard, Polarisation de la Lumière (Masson, Paris, 1994).
27. E. Collett, Polarized Light - Fundamentals and Application (Dekker, New York, 1993).
28. J. C. Stover, Optical Scattering - Measurement and Analysis (SPIE, Washington, 1995).
29. R. M. Azzam, Opt. Lett. 11, 270 (1986).
30. R. M. Azzam and A. G. Lopez, Opt. Eng. (Bellingham) 30, 1583 (1991).
31. A. Moritany, Y. Okuda, and J. Nakai, Appl. Opt. 22, 1329 (1983).
32. Conoptics INC. 19 Eagle Road, Danbury, CT 06810.
33. O. Acher, E. Bigan, and B. Drevillon, Rev. Sci. Instrum. 60, 65 (1989).
34. E. Compain and B. Drevillon, Appl. Opt. (to be published).
35. E. D. Palik, Handbook Of Optical Constants Of Solids, edited by E. D. Palik (Academic, London, 1985).
36. E. Compain, B. Drevillon, J. E. Bouree, J. Hue, and J. Y. Parey, Thin Solid Films (to be published).
37. M. M. W. Williams, Appl. Opt. 25, 3616 (1986).
38. W. S. Bickel, R. R. Zito, and V. Iafelice, J. Appl. Phys. 61, 5392 (1987).
39. B. W. Bell, Opt. Eng. (Bellingham) 28, 114 (1989).
40. S. M. Haugland, Appl. Opt. 31, 3847 (1992).
41. G. Videen, J. Y. Hsu, W. S. Bickel, and W. L. Wolfe, J. Opt. Soc. Am. A 9, 1111 (1992).
42. D. Felbacq, G. Tayeb, and D. Maystre, J. Opt. Soc. Am. A 11, 2526 (1994).
43. Y. Shindo, Opt. Eng. (Bellingham) 34, 3369 (1995).
44. A. Q. Sierra and A. V. D. Mora, Appl. Opt. 34, 6256 (1995).
45. R. Graaf, J. G. Aarnoudse, J. R. Zijp, P. M. A. Sloot, F. F. M. de Mul, J. Greve, and M. H. Koelink, Appl. Opt. 31, 1370 (1992).