An Isolated-Open Pattern to De-Embed Pad Parasitics

IEEE Microwave and Guided Wave Letters

Volumn 8, Issue 2, 1998, Pages 96-98

  Kim, Chung Hwan ^a   Kim, Cheon Soo ^a   Yu, Hyun Kyu ^a   Nam, Kee Soo ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

Cutoff frequency; De embedding; MOSFET

Indexed keywords

MOSFET DEVICES; PROBLEM SOLVING;

DE EMBEDDING; ISOLATED OPEN PATTERN; RADIO FREQUENCY (RF) PERFORMANCE;

CMOS INTEGRATED CIRCUITS;

EID: 0032002234     PISSN: 10518207     EISSN: None     Source Type: Journal    
DOI: 10.1109/75.658653     Document Type: Article

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